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Abstract
It is a known fact that the ZnO thin films find use in various fields, particularly in optoelectronic devices. But the factors that are responsible for the shape, size, crystalline behaviour, uniformity and stoichiometry of these thin films are still not fully understood. In this article an attempt has been made to prepare the thin films of ZnO of various molar concentrations by sol gel spin coating technique and determine their characteristics with the help of UV-Vis spectroscopy and x-diffraction studies.