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Abstract
Good quality manganese oxide thin films have been prepared with a sol-gel dip coating process. The films have been cast onto glass substrates with coatings applied for one and four minutes respectively. XRD patterns reveal that the films are amorphous in nature having only one peak corresponding to diffraction from [220] plane. The thicknesses of the films were determined from the weight difference method. In addition to the structural studies, optical characterization of pure MnO2 thin films were also investigated.